VT 750

Workshop Interferometer

VERTICAL INTERFEROMETER SYSTEM

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  • precision interferometer tower for production-, quality inspection- and metrology lab environments
  • natural granite column with extremely flat and precise guiding surfaces provide for ease of use and very accurate measurement of radius of curvature on optical components
  • highly precise and accurate linear scale with exceptional resolution, directly interfaced to fringe analysis software
  • measurement table is balanced and guided on air bearing slide for quick, easy and accurate setup and movement
  • small foot print and exceptional value combined with high accuracy and and rigit, maintenance free design
  • robust vibration damping system, prefect for use in industrial production environments
  • XONOX X-fiz 100 (4") or X-fiz 130 (5.2") high performance Fizeau interferometer with electronic control of optical zoom (1x to 10x), focus and contrast
  • innovative, powerful and user friendly fringe analysis sys- tem X-fringe2 with different smart and intelligent modes to suit various applications
  • choose from low cost "ST" version with static fringe analysis up to high performance "PS2" phase shifting version
  • system can be equipped either with PC table, 2 screens, mouse and keyboard or with built-in PC and and touch panel for optimized operation and minimized space requirement in production environment
  • additionally available in a "tower only" version "B" for integrating existing or 3rd party interferometer units or version "Z" equipped with ZYGO Verifire and ZYGO MX fringe analysis software

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TECHICAL DATA VT750

WORKING RANGE 

  • min. 750mm travel (800mm linear scale range), up to 200mm test diameter (depending on used TS and part holder)
    + micrometer fine adjustment for easy and precise setting of cats eye and confocal position 

VERSIONS 

 
  • VT750 ST with XONOX X-fiz 100 (4") / X-fiz 130 (5.2") with 10x optical zoom and static fringe analysis system
    XONOX "X-fringe ST" 
  • VT750 PS2 with XONOX X-fiz 100 (4") / X-fiz 130 (5.2") with 10x optical zoom, phase shifting fringe analysis system
    XONOX "X-fringe2" and piezo phase shifter XONOX "X-phase PMR"
  • VT750 Z with ZYGO Verifire 4" or 6" interferometer unit and Mx / MetroPro phase shifting fringe analysis
  • VT750 B "tower only" version for integrating existing interferometer units.
  • Optionally with XONOX fringe analysis system X-fringe ST or X-fringe PS2 with X-phase PMR phase shifter.
 

MEASURING SYSTEM

  • incremental high precision linear measuring system with PC interface + attachment SRM-plus for short radius measurement (option) or laser distance measuring system (option)

MEASURING ACCURACY 

  • up to +/- 0.7μ per 500mm , up to 1 nanometer resolution

DIMENSIONS (WxDxH)

  • 800 x 900 x 1900 mm when using touch screen for fringe analysis (additional space required if PC is used for fringe analysis, XONOX PC-table optionally available)

WEIGHT
  • approx. 500kg

CONNECTIONS

  • 110-240 V / 50-60 Hz /Air pressure min. 6bar

COLOR

  • Light grey RAL 7035
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