CT200 NC

CT200 NC

NON-CONTACT THICKNESS MEASUREMENT SYSTEM

  • highly precise and easy to use non-contact system for measuring the thickness of optical elements in both, production and quality inspection environments
  • integrated interferometric sensor for fast, reliable and high precision thickness measurement
  • measurement of single elements and doublets
  • lenses automatically centered with an innovative precision
    3-jaw chuck system
  • measurements of elements with one side access only is accommodated
  • ideal for testing lenses - even sticked on holders - with demanding CT tolerances in the polishing operation
  • ergonomically positioned lens holder provides for safe, easy and fast loading and setup of workpieces
  • conveniently located touch screen allows for simple and quick operation
  • large measurement range from micro-optics up to Ø200mm
  • extensive integrated glass database provides ready access to index data
  • supported connectivity to CT200 allows for automatic analysis of unknown index values
  • equipped with feature rich software and controller package,
    “X-ctNC” and touchscreen interface 

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X-ctNC1
 
 
X-ct2
 
 
X-ct3
 
 
 

CT200 NC Technical Data

WORKING RANGE 

  • 85mm max. optical thickness, max. part thickness depending on material index

DIAMETER RANGE 

  • from micro optics sizes up to ∅200 mm 

MEASURING SYSTEM

  • Optical low coherence inteferometer with precision incremental encoder 

MEASURING ACCURACY 

  • Resolution: 0.0001 mm
  • Accuracy: ≦ 0.0005mm (depending on lens centration)
  • Repeatability: better 1μ

DIMENSIONS (WxDxH)

  • 530 x 490 x 540 mm (plus touch screen height on top of instrument)

WEIGHT
  • approx. 25kg

CONNECTIONS

  • 110-240 V / 50-60 Hz

COLOR

  • Light grey RAL 7035