Vertical Interferometer System with 750mm Z-Axis

vertical interferometer system


  • precision interferometer tower for production-, quality-, inspection- and metrology lab environments


  • exceptionally large measuring range for radii up to 800mm


  • natural granite column with extremely flat and precise guiding sur-faces provide for ease of use and very acurate measurement of radius if curvature in optical components


  • highly precise and accurate linear scale with exceptional resolution, directly interfaced to fringe analysis software


  • measurement table is balanced and guided on air bearing slide for quick, easy and accurate setup and movement


  • small footprint and exceptional value combined with high accuracy and rigit, maintenance free design


  • robust vibration damping system, perfect for use in industrial pro-duction environments


  • XONOX X-fiz 100 (4") or X-fiz 150 (6") high performance fizeau interferometer with electionical control of zoom, focus and contrast/saturation


  • innovative, powerful and user friendly fringe analysis system X-fringe PS2 with different smart and intelligent modes to suit various applications


  • system can be equipped eiter with PC table, 2 screens, mouse and keyboard or with touch panel for optimized operation and mini-mized space requirement in production environment


  • additionally available in a "tower only" version "B" for integrating existing or 3rd party interferometer units


TECHNICAL DATA VT750

  • WORKING RANGE

    Min. 750mm travel (800mm linear scale range), up to 200mm test diameter (depending on used TS and partholder) + micrometer fine adjustment for easy and precise setting of catseye and confocal position


    Distance between column and optical axis = 145mm allows for lodaing workpieces up to Ø290mm


    Adaptation diameter for lens holders = Ø152.4mm

  • VERSIONS

    VT750 PS2 with XONOX X-fiz 100 (4“ & 5,2“) / X-fiz 150 (6“) with eletronic zoom, focus and contrast (saturation) controll and 5MPX CMOS camera.

    Phase shifting fringe analysis system XONOX „X-fringe PS2“ and piezo phase shifter XONOX „X-phase PMR“


    VT750 B „tower only“ version for integrating existing interferometer units. Optionally with XONOX fringe analysis system X-fringe PS2 and X-phase PMR phase shifter.

  • MEASURING AXIS

    counterbalanced, air bearing guided axis with smooth, „zero weight“ manual movement via handle (standard). Optionally electric driven via joystick (optional). Wear out and maintenance free design.

  • MEASURING SYSTEM

    incremental high precision linear measuring system with PC interface and temperature expansion compensation function

    (standard) / alternatively with „in axis“ distance measuring laser interferometer (LDM)with compensation unit for temperature, humidity and air preasure (optional)

  • MEASURING ACCURACY

    linear scale: up to +/- 1.5μm per 1000mm @ 20°C, up to 0.1μm resolution (standard 0.5μm) optionally with callibration and error compensation (on request)


    LDM: +/- 0.2 per 1000mm including automatic environmental compensation. Resolution 0.1μm.

  • VIBRATION ISOLATION

    Equipped with 4 adjustable passive vibration dampeners (standard). Optionally with active, piezo controlled vibration dampening

    system with 4 piezo blocks and fully automatic vibration dampening (optional)

  • DIMENSIONS (WxDxH)

    800 x 900 x 2650 mm when using touch screen and integrated PC for fringe analysis (additional space required if separate PC

    is used for fringe analysis, XONOX PC-table optionally available)

  • WEIGHT

    approx. 750kg

  • CONNECTIONS

    110-240 V / 50-60 Hz, compressed air: 6 bar

  • COLOR

    Light grey RAL 7035