Plano Sub-Aperture Stitchching Interferometer System
SUB APERTURE STITCHING INTERFEROMETER SYSTEM FOR PLANO OPTICS
- precise vertical interferometer for testing flat optical components in full aperture up to diameter/diagonal 600mm
- integrated, granite based, air-bearing provides precise and maintenance free horizontal and rotational motion
- easy to operate Tip-/Tilt setting for fringes adjustment
- automatic stitching pattern calculation according to workpiece shape and size
- electronic positioning for sub aperature measurements using electronic controlled C and Y axis
- precision, vibration dampened measuring table made of natural granite with high flatness for accurate analysis
- adjustable interferometer height for setting best position for different workpiece thicknesses
- XONOX X-fiz 150 (6") high performance phaseshifting Fizeau interferometer with 5MPX CMOS camera, stabilized diode laser and electronic control of zoom, focus and contrast
- innovative, powerful and user friendly fringe analysis system X-fringe PS2 with different smart and intelligent modes to suit various applications in non-stitching operation
- sub aperture stitchting software package for X-Fringe PS2 allowing full aperture analysis of large flat optical surfaces by combining a calculated number ob sub aperture measurements to a full surface analysis
