VT750

Vertical Interferometer System 

  •  precision interferometer tower for production-, quality inspection- and metrology lab environments
  • natural granite column with extremely flat and precise guiding surfaces provide for ease of use and very accurate measurement of radius of curvature on optical components
  • highly precise and accurate linear scale with exceptional resolution, directly interfaced to fringe analysis software
  • measurement table is balanced and guided on air bearing slide for quick, easy and accurate setup and movement
  • small foot print and exceptional value combined with high accuracy and and rigit, maintenance free design
  • robust vibration damping system, prefect for use in industrial production environments
  • XONOX X-fiz 100 (4") or X-fiz 130 (5.2") high performance Fizeau interferometer with electronic control of optical zoom (1x to 10x), focus and contrast
  • innovative, powerful and user friendly fringe analysis system X-fringe² with different smart and intelligent modes to suit various applications
  • choose from low cost "ST" version with static fringe analysis up to high performance "PS2" phase shifting version
  • system can be equipped either with PC table, 2 screens, mouse and keyboard or with built-in PC and and touch panel for optimized operation and minimized space requirement in production environment
  • additionally available in a "tower only" version "B" for integrating existing or 3rd party interferometer units or version "Z" equipped with ZYGO Verifire and ZYGO MX fringe analysis software

TECHNICAL DATA VT750

  • WORKING RANGE

    min. 750mm travel (800mm linear scale range), up to 200mm test diameter (depending on used TS and part holder) 

    + micrometer fine adjustment for easy and precise setting of cats eye and confocal position 

  • VERSIONS
    • VT750 ST with XONOX X-fiz 100 (4") / X-fiz 130 (5.2") with 10x optical zoom and static fringe analysis system XONOX "X-fringe ST
    • VT750 PS2 with XONOX X-fiz 100 (4") / X-fiz 130 (5.2") with 10x optical zoom, phase shifting fringe analysis system  XONOX "X-fringe²" and piezo phase shifter XONOX "X-phase PMR"
    • VT750 Z with ZYGO Verifire 4" or 6" interferometer unit and Mx phase shifting fringe analysis
    • VT750 B "tower only" version for integrating existing interferometer units.
    • Optionally with XONOX fringe analysis system X-fringe² ST or X-fringe² PS with X-phase PMR phase shifter.
  • MEASURING SYSTEM

    Incremental high precision linear measuring system with PC interface and terperature expansion compensation function (standard) / alternatively laser disctance measuring system (option)

  • MEASURING ACCURACY

    up to +/- 0.7μm per 500mm @ 20°C , up to 0.1µm resolution (standard 0.5µm)

  • DIMENSIONS (WxDxH) / Weight

    800 x 900 x 2100 mm when using touch screen for fringe analysis (additional space required if PC is used for fringe analysis, XONOX PC-table optionally available) / approx. 500kg

  • CONNECTIONS

    10-240 V / 50-60 Hz, compressed air: 6 bar

  • COLOR

    Light grey RAL 7035

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